Semiconductor

Wafer

TH2-400X400SW

Light In Use

TH2-400X400SW

Outline inspection of the wafer sample

Wafer Inspection using LDL-100X100IR2-940
LDL-100X100IR2-940

Light In Use

LDL-100X100IR2-940

Surface inspection of wafer sample

Wafer Inspection using MSU-10
MSU-10

Light In Use

MSU-10

Optical Character Recognition(OCR) on wafer sample

Semiconductor Wafer
LDR-75BL2-LA1

Light In Use

LDR-75BL2-LA1

Detection of foreign particles on the wafer sample

IC Chip

Light In Use

TH2-63X60SW

Outline inspection of IC

Light In Use

LFV3-CP-18RD2

Surface inspection of IC

Diode

Light In Use

LDL-PF-52X18SW

Optical Character Recognition(OCR) on diode